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» Verifying VLSI Circuits
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GLVLSI
1999
IEEE
86views VLSI» more  GLVLSI 1999»
13 years 11 months ago
Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
Mostafa H. Abd-El-Barr, Yanging Xu, Carl McCrosky
GLVLSI
1999
IEEE
96views VLSI» more  GLVLSI 1999»
13 years 11 months ago
A Correlation Matrix Method of Clock Partitioning for Sequential Circuit Testability
Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agraw...
GLVLSI
1999
IEEE
92views VLSI» more  GLVLSI 1999»
13 years 11 months ago
Pseudo-Exhaustive Testing of Sequential Circuits
Bassam Shaer, Sami A. Al-Arian, David L. Landis
GLVLSI
1998
IEEE
93views VLSI» more  GLVLSI 1998»
13 years 11 months ago
Identifying High-Level Components in Combinational Circuits
Travis E. Doom, Jennifer L. White, Anthony S. Wojc...
GLVLSI
1997
IEEE
131views VLSI» more  GLVLSI 1997»
13 years 11 months ago
Analog Circuit Model of Lamprey Unit Pattern Generator
Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...