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search results - page 8 / 219
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Verifying VLSI Circuits
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68
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GLVLSI
1999
IEEE
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Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
15 years 7 months ago
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Mostafa H. Abd-El-Barr, Yanging Xu, Carl McCrosky
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1999
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A Correlation Matrix Method of Clock Partitioning for Sequential Circuit Testability
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Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agraw...
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89
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GLVLSI
1999
IEEE
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Pseudo-Exhaustive Testing of Sequential Circuits
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Bassam Shaer, Sami A. Al-Arian, David L. Landis
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63
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GLVLSI
1998
IEEE
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GLVLSI 1998
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Identifying High-Level Components in Combinational Circuits
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Travis E. Doom, Jennifer L. White, Anthony S. Wojc...
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81
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GLVLSI
1997
IEEE
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GLVLSI 1997
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Analog Circuit Model of Lamprey Unit Pattern Generator
15 years 7 months ago
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Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...
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