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TCAD
2010
88views more  TCAD 2010»
13 years 2 months ago
Stress Aware Layout Optimization Leveraging Active Area Dependent Mobility Enhancement
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
Ashutosh Chakraborty, Sean X. Shi, David Z. Pan
TCAD
2010
136views more  TCAD 2010»
13 years 2 months ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris
TCOS
2010
13 years 2 months ago
Green Secure Processors: Towards Power-Efficient Secure Processor Design
With the increasing wealth of digital information stored on computer systems today, security issues have become increasingly important. In addition to attacks targeting the softwar...
Siddhartha Chhabra, Yan Solihin
TDP
2010
166views more  TDP 2010»
13 years 2 months ago
Communication-Efficient Privacy-Preserving Clustering
The ability to store vast quantities of data and the emergence of high speed networking have led to intense interest in distributed data mining. However, privacy concerns, as well ...
Geetha Jagannathan, Krishnan Pillaipakkamnatt, Reb...
TIM
2010
168views Education» more  TIM 2010»
13 years 2 months ago
Thermal Event Recognition Applied to Protection of Tokamak Plasma-Facing Components
Magnetic confinement fusion tokamaks are complex devices where a large amount of power is required to make the fusion reactions happen. In such experimental conditions, Plasma Faci...
Vincent Martin, Jean-Marcel Travere, Franço...
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