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ISQED
2003
IEEE
233views Hardware» more  ISQED 2003»
14 years 27 days ago
Active Device under Bond Pad to Save I/O Layout for High-pin-count SOC
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang
JOIN
2007
69views more  JOIN 2007»
13 years 7 months ago
Layout of an Arbitrary Permutation in a Minimal Right Triangle Area
In VLSI layout of interconnection networks, routing two-point nets in some restricted area is one of the central operations. It aims usually to minimize the layout area, while red...
Maria Artishchev-Zapolotsky, Yefim Dinitz, Shimon ...
ICCAD
2001
IEEE
111views Hardware» more  ICCAD 2001»
14 years 4 months ago
Congestion Aware Layout Driven Logic Synthesis
In this paper, we present novel algorithms that effectively combine physical layout and early logic synthesis to improve overall design quality. In addition, we employ partitionin...
Thomas Kutzschebauch, Leon Stok
DAC
2005
ACM
13 years 9 months ago
A watermarking system for IP protection by a post layout incremental router
In this paper, we introduce a new watermarking system for IP protection on post-layout design phase. Firstly the copyright is encrypted by DES (Data Encryption Standard) and then ...
Tingyuan Nie, Tomoo Kisaka, Masahiko Toyonaga
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 1 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...