29 search results - page 5 / 6 » Working with process variation aware caches |
ISLPED
2010
ACM
13 years 8 months ago
2010
ACM
Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of...
TC
2011
13 years 3 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
GECCO
2007
Springer
14 years 2 months ago
2007
Springer
Crossover in Genetic Programming is mostly a destructive operator, generally producing children worse than the parents and occasionally producing those who are better. A recently ...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract—This work proposes reliability aware through silicon via (TSV) planning for the 3D stacked silicon integrated circuits (ICs). The 3D power distribution network is modele...
ECCV
2006
Springer
14 years 10 months ago
2006
Springer
Abstract. Active Appearance Models (AAM) are compact representations of the shape and appearance of objects. Fitting AAMs to images is a difficult, non-linear optimization task. Tr...