17 search results - page 3 / 4 » Yield Improvement, Fault-Tolerance to the Rescue |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
LCN
2008
IEEE
14 years 1 months ago
2008
IEEE
Abstract—Distributed interactive applications may have stringent latency requirements and dynamic user groups. These applications may benefit from a group communication system, ...
ISCI
2008
13 years 7 months ago
2008
The recent evolution of wireless sensor networks have yielded a demand to improve energy-efficient scheduling algorithms and energy-efficient medium access protocols. This paper p...