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DATE
2000
IEEE
134views Hardware» more  DATE 2000»
14 years 28 days ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee
DATE
2000
IEEE
110views Hardware» more  DATE 2000»
14 years 28 days ago
A BIST Scheme for On-Chip ADC and DAC Testing
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
ADC
2000
Springer
146views Database» more  ADC 2000»
14 years 26 days ago
Handling Dynamic Schema Change in Process Models
Workflow technology has emerged as an appropriate platform for consolidating the distributed information resources of an enterprise, promoting interoperability across cross-platfo...
Shazia W. Sadiq
ADC
2000
Springer
82views Database» more  ADC 2000»
14 years 26 days ago
Querying Databases of Annotated Speech
Annotated speech corpora are databases consisting of signal data along with time-aligned symbolic ‘transcriptions’. Such databases are typically multidimensional, heterogeneou...
Steve Cassidy, Steven Bird
ADC
2000
Springer
326views Database» more  ADC 2000»
14 years 26 days ago
T-Tree or B-Tree: Main Memory Database Index Structure Revisited
While the B-tree (or the B+ -tree) is the most popular index structure in disk-based relational database systems, the Ttree has been widely accepted as a promising index structure...
Hongjun Lu, Yuet Yeung Ng, Zengping Tian