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aspdac 2008
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A slew-rate controlled output driver with one-cycle tuning time
15 years 5 months ago
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Young-Ho Kwak, Inhwa Jung, Chulwoo Kim
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Symmetry-aware placement with transitive closure graphs for analog layout design
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Lihong Zhang, C.-J. Richard Shi, Yingtao Jiang
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A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults
15 years 5 months ago
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Fei Wang, Yu Hu, Huawei Li, Xiaowei Li
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On reducing both shift and capture power for scan-based testing
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Jia Li, Qiang Xu, Yu Hu, Xiaowei Li
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Parallel fault backtracing for calculation of fault coverage
15 years 5 months ago
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Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jut...
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