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17

ASPDAC
2008
ACM

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On reducing both shift and capture power for scan-based testing

14 years 1 months ago

On reducing both shift and capture power for scan-based testing

Download www.cse.cuhk.edu.hk

Jia Li, Qiang Xu, Yu Hu, Xiaowei Li

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ASPDAC 2008 | Hardware |

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Added	12 Oct 2010
Updated	12 Oct 2010
Type	Conference
Year	2008
Where	ASPDAC
Authors	Jia Li, Qiang Xu, Yu Hu, Xiaowei Li

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