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ATS
2002
IEEE
74views Hardware» more  ATS 2002»
14 years 3 months ago
Evolutionary Test Program Induction for Microprocessor Design Verification
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
ET
2002
122views more  ET 2002»
13 years 10 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
ATS
2002
IEEE
136views Hardware» more  ATS 2002»
14 years 3 months ago
Recent Advances in Test Planning for Modular Testing of Core-Based SOCs
Test planning for core-based system-on-a-chip (SOC) designs is necessary to reduce testing time and test cost. In this paper, we survey recent advances in test planning that addre...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
ATS
2002
IEEE
95views Hardware» more  ATS 2002»
14 years 3 months ago
Effective Error Diagnosis for RTL Designs in HDLs
We propose an effective approach to diagnose multiple design errors in HDL designs with only one erroneous test case. Error candidates will be greatly reduced while ensuring that ...
Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou