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ATS
2005
IEEE
98views Hardware» more  ATS 2005»
14 years 2 months ago
Untestable Multi-Cycle Path Delay Faults in Industrial Designs
The need for high-performance pipelined architectures has resulted in the adoption of latch based designs with multiple, interacting clocks. For such designs, time sharing across ...
Manan Syal, Michael S. Hsiao, Suriyaprakash Natara...
ATS
2005
IEEE
144views Hardware» more  ATS 2005»
14 years 2 months ago
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
ATS
2005
IEEE
91views Hardware» more  ATS 2005»
14 years 2 months ago
SOC Test Scheduling with Test Set Sharing and Broadcasting
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ATS
2005
IEEE
164views Hardware» more  ATS 2005»
13 years 10 months ago
A Family of Logical Fault Models for Reversible Circuits
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
ATVA
2005
Springer
132views Hardware» more  ATVA 2005»
14 years 2 months ago
Flat Counter Automata Almost Everywhere!
Abstract. This paper argues that flatness appears as a central notion in the verification of counter automata. A counter automaton is called flat when its control graph can be ...
Jérôme Leroux, Grégoire Sutre