As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...