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ISQED
2006
IEEE
124views Hardware» more  ISQED 2006»
14 years 4 months ago
DFM Metrics for Standard Cells
Design for Manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. ...
Robert C. Aitken
ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 4 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
ISSRE
2006
IEEE
14 years 4 months ago
Studying the Characteristics of a "Good" GUI Test Suite
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
Qing Xie, Atif M. Memon
MICRO
2006
IEEE
145views Hardware» more  MICRO 2006»
14 years 4 months ago
Virtually Pipelined Network Memory
We introduce virtually-pipelined memory, an architectural technique that efficiently supports high-bandwidth, uniform latency memory accesses, and high-confidence throughput eve...
Banit Agrawal, Timothy Sherwood
NOMS
2006
IEEE
146views Communications» more  NOMS 2006»
14 years 4 months ago
BGP-Inspect - Extracting Information from Raw BGP Data
— While BGP routing datasets, consisting of raw routing data, are freely available and easy to obtain, extracting any useful information is tedious. Currently, researcher and net...
Dionysus Blazakis, Manish Karir, John S. Baras