A language for defining design discipline characteristics is proesign discipline characteristics such as abstraction levels, design object classifications and decompositions, desi...
: Electromigration induced degradation in integrated circuits has been accelerated by continuous scaling of device dimensions. We present a methodology for synthesizing high-reliab...
Concurrent verification of hardware and software as part of the development process can shorten the time to market of complex systems. The objectives of the Virtual CPU approach i...
Hot-carrier eects and electromigration are the two important failure mechanisms that signicantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...