70 search results - page 7 / 14 » date 1997 |
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
In modern computer systems the performance is dominated by the memory performance. Currently, there is neither a systematic design methodology nor a tool for the design of memory ...
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
In this paper a new approach is presented to build a list of faults to be used by the fault injection environment; the list is built starting from a high-level description of the ...