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DATE
2002
IEEE
135views Hardware» more  DATE 2002»
14 years 2 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu
DATE
2002
IEEE
114views Hardware» more  DATE 2002»
14 years 2 months ago
A Video Compression Case Study on a Reconfigurable VLIW Architecture
In this paper, we investigate the benefits of a flexible, application-specific instruction set by adding a run-time Reconfigurable Functional Unit (RFU) to a VLIW processor. Preli...
Davide Rizzo, Osvaldo Colavin
DATE
2002
IEEE
242views Hardware» more  DATE 2002»
14 years 2 months ago
Automatic Generation of Common-Centroid Capacitor Arrays with Arbitrary Capacitor Ratio
The key performance of many analog circuits is directly related to accurate capacitor ratios. It is well known that capacitor ratio precision is greatly enhanced by paralleling id...
Mohamed Dessouky, DiaaEldin Sayed
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
14 years 2 months ago
Problems Due to Open Faults in the Interconnections of Self-Checking Data-Paths
In this work, the problem of open faults affecting the interconnections of SC circuits composed by data-path and control is analyzed. In particular, it is shown that, in case open...
Michele Favalli, Cecilia Metra
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
14 years 2 months ago
Exact Grading of Multiple Path Delay Faults
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
Saravanan Padmanaban, Spyros Tragoudas