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DATE
2002
IEEE
136views Hardware» more  DATE 2002»
14 years 2 months ago
Beyond UML to an End-of-Line Functional Test Engine
In this paper, we analyze the use of UML as a starting point to go from design issues to end of production testing of complex embedded systems. The first point is the analysis of ...
Andrea Baldini, Alfredo Benso, Paolo Prinetto, Ser...
DATE
2002
IEEE
131views Hardware» more  DATE 2002»
14 years 2 months ago
Passive Constrained Rational Approximation Algorithm Using Nevanlinna-Pick Interpolation
As system integration evolves and tighter design constraints must be met, it becomes necessary to account for the non-ideal behavior of all the elements in a system. For high-spee...
Carlos P. Coelho, Luis Miguel Silveira, Joel R. Ph...
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
14 years 2 months ago
E-Design Based on the Reuse Paradigm
This paper gives an overview on a Virtual electronic component or IP (Intellectual Property) exchange infrastructure whose main components are a XML "well structured IP e-cat...
L. Ghanmi, A. Ghrab, M. Hamdoun, B. Missaoui, K. S...
DATE
2002
IEEE
95views Hardware» more  DATE 2002»
14 years 2 months ago
A Polynomial Time Optimal Diode Insertion/Routing Algorithm for Fixing Antenna Problem
Abstract—Antenna problem is a phenomenon of plasma-induced gateoxide degradation. It directly affects manufacturability of very large scale integration (VLSI) circuits, especiall...
Li-Da Huang, Xiaoping Tang, Hua Xiang, D. F. Wong,...
DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 2 months ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...