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date 2006
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DATE
2006
IEEE
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Efficient on-line interconnect testing in FPGAs with provable detectability for multiple faults
14 years 3 months ago
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Vishal Suthar, Shantanu Dutt
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DATE
2006
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An integrated scratch-pad allocator for affine and non-affine code
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Sumesh Udayakumaran, Rajeev Barua
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DATE
2006
IEEE
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RAS-NANO: a reliability-aware synthesis framework for reconfigurable nanofabrics
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Chen He, Margarida F. Jacome
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DATE
2006
IEEE
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On the numerical verification of probabilistic rewriting systems
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Jounaïdi Ben Hassen, Sofiène Tahar
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2006
IEEE
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Strong conflict analysis for propositional satisfiability
14 years 3 months ago
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HoonSang Jin, Fabio Somenzi
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