21 search results - page 3 / 5 » ddecs 2007 |
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
– Algorithmic State Machines are a 40-year old tool for the design of digital circuits. They are a good alternative to Finite State Machines, where only states can be properly de...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
This paper proposes debug patterns combined with an intuitive flow to accelerate and simplify the debugging of SystemC designs. A debug pattern provides a formalized procedure to f...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...