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DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify i...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
This paper proposes a new fault model and its modeling and analysis methods in a clockless asynchronous wave pipeline for extensive yield evaluation and assurance. It is highly de...