36 search results - page 5 / 8 » dft 2003 |
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
IPPS
2003
IEEE
13 years 12 months ago
2003
IEEE
In this paper we use a mathematical approach to automatically generate high performance short vector code for the discrete Fourier transform (DFT). We represent the well-known Coo...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...