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DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
Data flow graph dominant designs, such as communication video and audio applications, are common in today’s IC industry. In these designs, the datapath resources (e.g., adders,...
DFT
2005
IEEE
13 years 9 months ago
2005
IEEE
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...