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ITC
2000
IEEE
101views Hardware» more  ITC 2000»
14 years 1 months ago
Reducing test data volume using external/LBIST hybrid test patterns
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Debaleena Das, Nur A. Touba
COLING
2000
13 years 10 months ago
A Hybrid Japanese Parser with Hand-crafted Grammar and Statistics
This paper describes a hybrid parsing method for Japanese which uses both a hand-crafted grammar and a statistical technique. The key feature of our system is that in order to est...
Hiroshi Kanayama, Kentaro Torisawa, Yutaka Mitsuis...
ICC
2000
IEEE
14 years 1 months ago
A Novel Push-and-Pull Hybrid Data Broadcast Scheme for Wireless Information Networks
: A new push-and-pull hybrid data broadcast scheme is proposed for providing wireless information services to three types of clients, general, pull and priority clients. Only pull ...
Jian-Hao Hu, Kwan Lawrence Yeung, Gang Feng, K. F....
ENDM
2000
174views more  ENDM 2000»
13 years 8 months ago
Hybrid Constraints in Automated Model Synthesis and Model Processing
Both parametric design tasks and analysis tasks of technical systems have a similar problem setting: The structure of the system to be configured or analyzed is defined already. W...
Klaus-Ulrich Leweling, Benno Stein
JILP
2000
103views more  JILP 2000»
13 years 8 months ago
Comparing and Combining Profiles
How much do two profiles of the same program differ? When has a profile changed enough to warrant reexamination of the profiled program? And how should two or more profiles be com...
Serap A. Savari, Cliff Young