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APSEC
2000
IEEE
13 years 12 months ago
2000
IEEE
Survivability is the ability of a system to continue operating despite the presence of abnormal events such as failures and intrusions. Ensuring system survivability has increased...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
ICS
2000
Tsinghua U.
13 years 11 months ago
2000
Tsinghua U.
As the performance gap between the CPU and main memory continues to grow, techniques to hide memory latency are essential to deliver a high performance computer system. Prefetchin...