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ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
This paper describes a procedure for minimizing the power consumption in a boolean network under the zero delay model. Power is minimized by modifying the function of each interme...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
Given a set of specifications for a targeted application, algorithm selection refers to choosing the most suitable algorithm for a given goal, among several functionally equivalen...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
We present an improved data model that reflects the whole VLSI design process including bottom-up and topdown design phases. The kernel of the model is a static version concept th...