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ICCAD
2006
IEEE
124views Hardware» more  ICCAD 2006»
14 years 6 months ago
A linear-time approach for static timing analysis covering all process corners
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
Sari Onaissi, Farid N. Najm
ICCAD
2006
IEEE
116views Hardware» more  ICCAD 2006»
14 years 6 months ago
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
Erkan Acar, Sule Ozev, Kevin B. Redmond
ICCAD
2006
IEEE
131views Hardware» more  ICCAD 2006»
14 years 6 months ago
Fast wire length estimation by net bundling for block placement
The wire length estimation is the bottleneck of packing based block placers. To cope with this problem, we present a fast wire length estimation method in this paper. The key idea...
Tan Yan, Hiroshi Murata
ICCAD
2006
IEEE
101views Hardware» more  ICCAD 2006»
14 years 6 months ago
Guaranteeing performance yield in high-level synthesis
Meeting timing constraint is one of the most important issues for modern design automation tools. This situation is exacerbated with the existence of process variation. Current hi...
Wei-Lun Hung, Xiaoxia Wu, Yuan Xie
ICCAD
2006
IEEE
108views Hardware» more  ICCAD 2006»
14 years 6 months ago
From molecular interactions to gates: a systematic approach
The continuous minituarization of integrated circuits may reach atomic scales in a couple of decades. Some researchers have already built simple computation engines by manipulatin...
Josep Carmona, Jordi Cortadella, Yousuke Takada, F...