-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
Wireless sensor networks hold the potential to open new domains to distributed data acquisition. However, such networks are prone to premature failure because some nodes deplete t...
Hengyu Long, Yongpan Liu, Yiqun Wang, Robert P. Di...
We present a rigorous framework that defines a class of net weighting schemes in which unconstrained minimization is successively performed on a weighted objective. We show that, ...
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. ...
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...