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ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
This paper proposes a stochastic dynamic thermal management (DTM) technique in high-performance VLSI system with especial attention to the uncertainty in temperature observation. ...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
Abstract— In this paper, we introduce a novel preimage computation technique that directly computes the circuit cofactors without an explicit search for any satisfiable solution...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
— Microprocessors can have design errors that escape the test and validation process. The cost to rectify these errors after shipping the processors can be very expensive as it m...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...