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DATE
2010
IEEE
14 years 4 months ago
2010
IEEE
To meet customer’s product-quality expectations, each individual IC needs to be tested for manufacturing defects incurred during its many high-precision, and hence defect-prone ...
ISQED
2010
IEEE
14 years 5 months ago
2010
IEEE
— Algorithms and tools used for IC implementation do not show deterministic and predictable behaviors with input parameter changes. Due to suboptimality and inaccuracy of underly...
ICS
2010
Tsinghua U.
14 years 3 months ago
2010
Tsinghua U.
: Maximizing revenue in the presence of perfectly informed players is a well known goal in mechanism design. Yet, all current mechanisms for this goal are vulnerable to equilibrium...
APCCM
2010
13 years 12 months ago
2010
Measuring information content (IC) from the intrinsic information of an ontology is an important however a formidable task. IC is useful for further measurement of the semantic si...
VLSI
2010
Springer
13 years 9 months ago
2010
Springer
—This paper proposes a novel technique to exploit the high bandwidth offered by through silicon vias (TSVs). In the proposed approach, synchronous parallel 3D links are replaced ...