The development of user interfaces (UIs) is one of the most timeconsuming aspects in software development. In this context, the lack of proper reuse mechanisms for UIs is increasi...
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
Abstract-- In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all...
This paper describes the motivations, methods, and solution concepts for the use of ontologies for simulation model integration. Ontological analysis has been shown to be an effec...
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...