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WWW
2007
ACM
14 years 9 months ago
2007
ACM
The development of user interfaces (UIs) is one of the most timeconsuming aspects in software development. In this context, the lack of proper reuse mechanisms for UIs is increasi...
INTEGRATION
2008
13 years 9 months ago
2008
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Abstract-- In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all...
WSC
2007
13 years 11 months ago
2007
This paper describes the motivations, methods, and solution concepts for the use of ontologies for simulation model integration. Ontological analysis has been shown to be an effec...
ICCD
2007
IEEE
14 years 6 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...