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IOLTS
2006
IEEE
102views Hardware» more  IOLTS 2006»
14 years 1 months ago
Emulation-based Fault Injection in Circuits with Embedded Memories
FPGA emulation has proven to be a performance effective method to analyse the behaviour of digital circuits in the presence of soft errors due to SEU effects. In particular, the r...
Mario García-Valderas, Marta Portela-Garc&i...
IOLTS
2006
IEEE
84views Hardware» more  IOLTS 2006»
14 years 1 months ago
An Improved Technique for Reducing False Alarms Due to Soft Errors
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
Sandip Kundu, Ilia Polian
IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 1 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
IOLTS
2006
IEEE
103views Hardware» more  IOLTS 2006»
14 years 1 months ago
Designing Robust Checkers in the Presence of Massive Timing Errors
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
Frederic Worm, Patrick Thiran, Paolo Ienne