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ITC
1998
IEEE

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Modeling the unknown! Towards model-independent fault and error diagnosis

14 years 2 months ago

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Vamsi Boppana, Masahiro Fujita

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ITC
1998
IEEE

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Consequences of port restrictions on testing two-port memories

14 years 2 months ago

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Said Hamdioui, A. J. van de Goor

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ITC
1998
IEEE

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Failure modes for stiction in surface-micromachined MEMS

14 years 2 months ago

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Abhijeet Kolpekwar, Ronald D. Blanton, David Woodi...

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ITC
1998
IEEE

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DFT guidance through RTL test justification and propagation analysis

14 years 2 months ago

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Yiorgos Makris, Alex Orailoglu

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ITC
1998
IEEE

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An introduction to area array probing

14 years 2 months ago

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