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DFT
2003
IEEE
14 years 3 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ISCAS
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper addresses several aspects related to the distribution of content. The first aim is to provide an overview of the Universal Multimedia Access (UMA) concept. The primary...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
The first non-enumerative framework for diagnosing path delay faults using zero suppressed binary decision diagrams is introduced. We show that fault free path delay faults with ...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...