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DAC
2006
ACM
14 years 8 months ago
2006
ACM
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
CODES
2008
IEEE
14 years 2 months ago
2008
IEEE
We conducted a study of citations of papers published between 1996 and 2006 in the CODES and ISSS conferences, representing the hardware/software codesign and system synthesis com...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...