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ISQED
2008
IEEE
14 years 5 months ago
2008
IEEE
This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulati...
TC
2008
13 years 10 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ISCA
2008
IEEE
14 years 5 months ago
2008
IEEE
In a chip-multiprocessor (CMP) system, the DRAM system is shared among cores. In a shared DRAM system, requests from a thread can not only delay requests from other threads by cau...
ISCA
2008
IEEE
14 years 5 months ago
2008
IEEE
Flash is a widely used storage device that provides high density and low power, appealing properties for general purpose computing. Today, its usual application is in portable spe...
ISCA
2008
IEEE
14 years 5 months ago
2008
IEEE
Writing shared-memory parallel programs is error-prone. Among the concurrency errors that programmers often face are atomicity violations, which are especially challenging. They h...