Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Off-chip communication consumes a significant part of main memory system power. Existing solutions imply the use of specialized memories or assume error free environments. This i...
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay also has variat...
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...
Animesh Kumar, Huifang Qin, Prakash Ishwar, Jan M....