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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
The IEEE 1149.6 standard was approved in March of 2003. The standard extends the capability of the IEEE 1149.1 standard to include AC-coupled and/or differential nets. These nets ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In this paper we analyze the effects of transient faults (TFs) affecting the internal nodes of conventional latch structures and we propose a new latch design which allows to tole...