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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...