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ITC
2003
IEEE

On Reducing Wrapper Boundary Register Cells in Modular SOC Testing

14 years 4 months ago
On Reducing Wrapper Boundary Register Cells in Modular SOC Testing
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of wrapper boundary register cells. Since the very purpose of core wrappers is to provide controllability and observability for the cores-under-test, it is shown how the number of wrapper boundary register cells can be reduced without affecting the test quality. While a testing time overhead, caused by lower test concurrency, is incurred, there are clear benefits in reducing the necessary DFT area and especially in decreasing the propagation delays, which can improve the SOC’s functional timing performance.
Qiang Xu, Nicola Nicolici
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Qiang Xu, Nicola Nicolici
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