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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
MICRO
2003
IEEE
14 years 3 months ago
2003
IEEE
Abstract—High-speed routers often use commodity, fully-associative, TCAMs (Ternary Content Addressable Memories) to perform packet classification and routing (IP lookup). We prop...
MICRO
2003
IEEE
14 years 3 months ago
2003
IEEE
Large instruction window processors achieve high performance by exposing large amounts of instruction level parallelism. However, accessing large hardware structures typically req...
MICRO
2003
IEEE
14 years 3 months ago
2003
IEEE
A dynamic optimizer is a runtime software system that groups a program’s instruction sequences into traces, optimizes those traces, stores the optimized traces in a softwarebase...
MICRO
2003
IEEE
14 years 3 months ago
2003
IEEE
It is widely accepted that the disproportionate scaling of transistor and conventional on-chip interconnect performance presents a major barrier to future high performance systems...