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MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper describes FAST, a novel simulation methodology that can produce simulators that (i) are orders of magnitude faster than comparable simulators, (ii) are cycleaccurate, (...
MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
Transactional Memory (TM) systems must track the read and write sets—items read and written during a transaction—to detect conflicts among concurrent transactions. Several TM...
COMSWARE
2007
IEEE
14 years 4 months ago
2007
IEEE
Abstract— With the increasing demand for low-latency applications in the Internet, the slow convergence of the existing routing protocols is a growing concern. A number of IP fas...