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MR
2006
13 years 7 months ago
2006
We studied electromigration (EM) lifetimes and void growth at low cumulative failure probability. We carried out EM test in damascene Cu lines using sudden-death type test structu...
MR
2006
13 years 7 months ago
2006
The electrostatic discharge (ESD) robustness of different thin-film devices, including three diodes and two thin-film transistors (TFTs) in low-temperature polysilicon (LTPS) tech...
MR
2006
13 years 7 months ago
2006
A hemispherical silicon solid immersion lens (SIL) was used to improve the spatial resolution of front-side thermal IR imaging in lock-in mode. The bottom of the SIL was cone-shap...
MR
2007
13 years 7 months ago
2007
This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
MR
2007
13 years 7 months ago
2007
Electronic Prognostics (EP) is a technique used in high-reliability and high-availability systems to actively and proactively detect faults, allowing the reduction of system downt...