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MTDT
2002
IEEE
14 years 20 days ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
MTDT
2002
IEEE
14 years 20 days ago
2002
IEEE
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...