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ATS
2005
IEEE
80views Hardware» more  ATS 2005»
15 years 10 months ago
A Class of Linear Space Compactors for Enhanced Diagnostic
Thomas Clouqueur, Hideo Fujiwara, Kewal K. Saluja
ATS
2005
IEEE
91views Hardware» more  ATS 2005»
15 years 10 months ago
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths
Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hid...