Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

34

ATS
2005
IEEE

favoriteEmaildiscussreport

91views Hardware» more ATS 2005»

Design for Testability Based on Single-Port-Change Delay Testing for Data Paths

14 years 6 months ago

Design for Testability Based on Single-Port-Change Delay Testing for Data Paths

Download library.naist.jp

Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hid

Real-time Traffic

ATS 2005 | Hardware |

claim paper

Post Info
More Details (n/a)

Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	ATS
Authors	Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara

Comments (0)