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33

ATS
2005
IEEE

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Design for Testability Based on Single-Port-Change Delay Testing for Data Paths

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Design for Testability Based on Single-Port-Change Delay Testing for Data Paths

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Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hid

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Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	ATS
Authors	Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara

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