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ISPD
2007
ACM
13 years 10 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
ISPD
2007
ACM
13 years 10 months ago
2007
ACM
In this paper, we derive the X-half-perimeter wirelength (XHPWL) model for X-architecture placement and explore the effects of three different wire models on X-architecture plac...
ISPD
2007
ACM
13 years 10 months ago
2007
ACM
In this paper, we propose fast and efficient techniques to analyze the power grid with accurate modeling of the transistor network. The solution techniques currently available for...
ISSRE
2007
IEEE
13 years 10 months ago
2007
IEEE
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...
ISSTA
2007
ACM
13 years 10 months ago
2007
ACM
As concurrent and distributive applications are becoming more common and debugging such applications is very difficult, practical tools for automatic debugging of concurrent appl...