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DAC
2008
ACM
14 years 9 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2008
ACM
14 years 9 months ago
DeFer: deferred decision making enabled fixed-outline floorplanner
In this paper, we present DeFer -- a fast, high-quality and nonstochastic fixed-outline floorplanning algorithm. DeFer generates a non-slicing floorplan by compacting a slicing fl...
Jackey Z. Yan, Chris Chu
ICSE
2008
IEEE-ACM
14 years 9 months ago
ARTOO: adaptive random testing for object-oriented software
Intuition is often not a good guide to know which testing strategies will work best. There is no substitute for experimental analysis based on objective criteria: how many bugs a ...
Ilinca Ciupa, Andreas Leitner, Manuel Oriol, Bertr...
ICSE
2008
IEEE-ACM
14 years 9 months ago
Symbolic mining of temporal specifications
Program specifications are important in many phases of the software development process, but they are often omitted or incomplete. An important class of specifications takes the f...
Mark Gabel, Zhendong Su
SIGSOFT
2008
ACM
14 years 9 months ago
Javert: fully automatic mining of general temporal properties from dynamic traces
Program specifications are important for many tasks during software design, development, and maintenance. Among these, temporal specifications are particularly useful. They expres...
Mark Gabel, Zhendong Su