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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
13 years 12 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
ITC
2000
IEEE
123views Hardware» more  ITC 2000»
13 years 12 months ago
Combinational logic synthesis for diversity in duplex systems
We describe logic synthesis techniques for designing diverse implementations of combinational logic circuits in order to maximize the data integrity of diverse duplex systems in t...
Subhasish Mitra, Edward J. McCluskey
LICS
2000
IEEE
13 years 12 months ago
Complete Axioms for Categorical Fixed-Point Operators
We give an axiomatic treatment of fixed-point operators in categories. A notion of iteration operator is defined, embodying the equational properties of iteration theories. We p...
Alex K. Simpson, Gordon D. Plotkin
VLSID
2000
IEEE
75views VLSI» more  VLSID 2000»
13 years 12 months ago
Timing Analysis with Implicitly Specified False Paths
We consider the problem of timing analysis in the presence of known false paths. The main difficulty in adaptation of classical breadth-first search to the problem is that at each...
Eugene Goldberg, Alexander Saldanha
WECWIS
2000
IEEE
138views ECommerce» more  WECWIS 2000»
13 years 12 months ago
DTD-Miner: A Tool for Mining DTD from XML Documents
XML documents are semistructured and the structure of the documents is embedded in the tags. Although XML documents can be accompaniedby a DTD that defines the structure of the d...
Chuang-Hue Moh, Ee-Peng Lim, Wee Keong Ng