Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
Complex embedded systems consist of hardware and software components from different domains, such as control and signal processing, many of them supplied by different IP vendors. ...
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...
This paper presents an environment for supporting parallel/distributed programming using Java with RMI and RMI-IIOP (CORBA). The environment implements the notion of Shared Object...
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...