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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 2 months ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
DATE
2002
IEEE
166views Hardware» more  DATE 2002»
14 years 2 months ago
Event Model Interfaces for Heterogeneous System Analysis
Complex embedded systems consist of hardware and software components from different domains, such as control and signal processing, many of them supplied by different IP vendors. ...
Kai Richter, Rolf Ernst
DELTA
2002
IEEE
14 years 2 months ago
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...
DEXAW
2002
IEEE
133views Database» more  DEXAW 2002»
14 years 2 months ago
ESOW: Parallel/Distributed Programming on the Web
This paper presents an environment for supporting parallel/distributed programming using Java with RMI and RMI-IIOP (CORBA). The environment implements the notion of Shared Object...
Denivaldo Lopes, Slimane Hammoudi, Zair Abdelouaha...
DFT
2002
IEEE
127views VLSI» more  DFT 2002»
14 years 2 months ago
A New Functional Fault Model for FPGA Application-Oriented Testing
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...