—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
Conventional scan design imposes considerable area and delay overhead by using larger scan
ip-
ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
—This paper addresses, from a probabilistic point of view, the issue of switching activity estimation in combinational circuits under the zero-delay model. As the main theoretica...
— Conventional methods for optimal sizing of wires and transistors use linear resistor-capacitor (RC) circuit models and the Elmore delay as a measure of signal delay. If the RC ...
Lieven Vandenberghe, Stephen P. Boyd, Abbas A. El ...
Abstract—We examine the implications of a new hazard-free combinational logic synthesis method [1], which generates multiplexor-based networks from binary decision diagrams (BDDs...
Kenneth Y. Yun, Bill Lin, David L. Dill, Srinivas ...